Process for fabricating a bipolar transistor with a thin base an

Metal working – Method of mechanical manufacture – Assembling or joining

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

29571, 29576E, 148 15, 148175, 148DIG92, 148DIG11, H01L 21322

Patent

active

045233705

ABSTRACT:
A process for fabricating a bipolar transistor with a thin base and an abrupt base-collector junction includes the steps of depositing a thin layer of polycrystalline or amorphous silicon base material in a single crystal collector region, while in-situ doping the deposited silicon with boron atoms, and thereafter, recrystallizing the deposited silicon layer by thermal-pulse annealing at a temperature high enough to effect recrystallization and solid phase epitaxial regrowth while low enough to minimize interdiffusion of dopants between the base and collector.
The process further includes providing the transistor fabricated by the aforedescribed steps with an abrupt base-emitter junction. This is accomplished by depositing n.sup.++ doped polysilicon with a LPCVD process and thereafter thermal annealing the polysilicon.

REFERENCES:
patent: 4252581 (1981-02-01), Anantha et al.
patent: 4269631 (1981-05-01), Anantha et al.
patent: 4270960 (1981-06-01), Bollen et al.
patent: 4272880 (1981-06-01), Pashley
patent: 4357622 (1982-11-01), Magdo et al.
patent: 4437897 (1984-03-01), Kemlage
patent: 4451844 (1984-05-01), Komatsu et al.
patent: 4452645 (1984-06-01), Chu et al.
Swartz et al., "An Uncompensated Silicon Bipolar Junction Transistor Fabricated Using Molecular Beam Epitaxy", IEEE Electron Device Letters, vol. EDL-2, No. 11, 11/1981.
Graul et al., "High-Performance Transistors with Arsenic-Implanted Polysil Emitters", IEEE Journal of Solid State Circuits, vol. SC-11, No. 4, Aug. 1976.
Ning et al., "Effect of Emitter Contact on Current Gain of Silicon Bipolar Devices", IEEE Transactions on Electron Devices, vol. ED-27, No. 11, Nov. 1980.
Xiangliu, "A New Type of Device Structure for Bipolar Logic IC's with Polysilicon Emitter Regions (PER)", Electronic Science and Technology (Chinese), p. 7, No. 7, 1980.
Xiangliu et al., "The Activation Effect of CW Laser Irradiation on Bipolar Transistors with Polysilicon Emitter Regions", Extended Abstracts, vol. 81-2, p. 1004, The Electrochemical Society, Fall Meeting, Denver, Colorado, 1981.
Gat, "Heat-Pulse Annealing of Arsenic-Implanted Silicon with a CW Arc Lamp", IEEE Electron Device Letters, vol. EDL-2, No. 4, Apr. 1981.
Lietoila et al., "The Rate of CW Laser Induced Solid Phase Epitaxial Regrowth of Amorphous", Appl. Phys. Lett. 39(10), Nov. 15, 1981.
Bean et al., "Laser Induced Epitaxy of Amorphous Deposited Silicon", AIP Conference Proceedings, 1978.
Weeks et al., "Laser Epitaxy Over Buried Layers", Materials Research Society Symposia Proceedings, 1981.
Petersen, "Ultra Thin Base, Beam-Crystallized Bipolar", IBM Tech. Discl. Bull. vol. 22, No. 11, Apr. 1980.
Nakata et al., "Novel Low-Temperature Recrystallization of a-Si by High Energy Ion Beam", Appl. Phys. Lett. vol. 40, No. 8, Apr. 1982.
Hendel et al., "Laser Annealing of Bipolar NPN Transistors", J. Vac. Sci. Tech. 18(3) Apr. 1981.
Shappir et al., "Polycrystalline Silicon Recrystallization by Combined CW Laser and Furnace Heating", J. Electrochemical Soc. vol. 131, No. 4, Apr. 1984.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process for fabricating a bipolar transistor with a thin base an does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process for fabricating a bipolar transistor with a thin base an, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for fabricating a bipolar transistor with a thin base an will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-974351

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.