Bus executed scan testing method and apparatus

Details Bus executed scan testing method and apparatus Bus executed scan testing method and apparatus

1989-02-10

1990-08-07

Smith, Jerry

Excavating

371 226, G01R 3128

Patent

active

049473956

ABSTRACT:
For LSI/VLSI integrated circuits which inherently have an address decoder and a data bus, a scan testing method and apparatus is presented which does not require additional pin connections to be dedicated for scan test implementation. Counter to the Joint Test Action Group approach, the present invention uses additional registers, multiplexers, and decoders in conjunction with the existing buses to provide test access to otherwise embedded layers of logic circuitry, without the addition of a single pin connection to a integrated circuit chip package. Further, since this test method and apparatus uses the data bus and registers just as the rest of the chip, slow and complex d.c. level shifting equipment is not required.

REFERENCES:
patent: 4534028 (1985-08-01), Trischler
patent: 4542505 (1985-09-01), Binoeder et al.
patent: 4571724 (1986-02-01), Belmondo et al.
patent: 4583223 (1986-04-01), Inoue et al.
patent: 4594544 (1986-06-01), Necoechea
patent: 4597080 (1986-06-01), Thatte et al.
patent: 4604746 (1986-08-01), Blum
patent: 4617663 (1986-10-01), Lake et al.
patent: 4620302 (1986-10-01), Binoeder et al.
patent: 4621363 (1986-11-01), Blum
patent: 4635261 (1987-01-01), Anderson et al.
patent: 4688222 (1987-08-01), Blum
patent: 4692691 (1987-09-01), Sueta
patent: 4697267 (1987-09-01), Wakai
patent: 4860290 (1989-08-01), Daniels
patent: 4872169 (1989-10-01), Whetsel
patent: 4897838 (1990-01-01), Tateishi

Affiliated with

Also associated with

Rating

Bus executed scan testing method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Bus executed scan testing method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Bus executed scan testing method and apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-965749