Solid state image sensing device with photodiode to reduce smear

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357 24, 357 20, 357 32, H01L 2714

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049472240

ABSTRACT:
In a solid state image sensing device of P-conductivity type well, photo-electro converting region (1) are configured to have a larger area as the depth increases, so that excessive electric charges generated in the p-conductivity type well are easily transferred from expanded peripheral parts (7) at the bottom (1b) to channel (3), without being undesirably transferred downward through thin p-conductivity type region 6 to substrate (4), and smear electric charges which has been generated in a thin p-conductivity type well under the photo-electro converting region in the conventional device is suppressed, to effectively decrease the smear phenomenon.

REFERENCES:
patent: 3838439 (1974-09-01), Biard
patent: 4450464 (1984-05-01), Yamada
patent: 4654682 (1987-03-01), Boudewijns
Oda et al., "A CCD Image Sensor with 768.times.490 Pixels," IEEE International Solid-State Circuits Conference, Feb. 25, 1983, pp. 264-265.
E. Oda et al., "A CCD Image Sensor with 768.times.490 Pixels"; pp. 264-265; 1983 IEEE International Solid-State Circuits Conference 2/25/83.

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