Method of testing a charge-coupled device

Details Method of testing a charge-coupled device Method of testing a charge-coupled device

1989-08-07

1990-07-17

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

357 24, G01R 3126, G11C 2900

Patent

active

049423576

ABSTRACT:
A method is disclosed for testing a charge-coupled device (CCD). A test device for use in the method includes a buried channel transistor which is formed adjacent the CCD. The source and drain of the transistor are located on opposite sides of the CCD. In the use of the test device to locate barriers and pockets in the CCD, clock voltages that are used in the operation of the CCD are applied to the gate electrodes of the CCD to simulate the transfer of charge from one phase to another. Predetermined voltages are then applied to the transistor, and the drain current and source voltage are measured in order to construct curves which indicate the existence and size of the barriers and pockets.

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patent: 4412343 (1983-10-01), Kosonocky
patent: 4509012 (1985-04-01), Lin
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