Socket for testing a plug-in type semiconductor

Details Socket for testing a plug-in type semiconductor Socket for testing a plug-in type semiconductor

1992-03-26

1992-12-08

Wieder, Kenneth A.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158P, 439263, 439264, G01R 102

Patent

active

051701170

ABSTRACT:
A socket for testing a plug-in type semiconductor having two rows of flat pins includes an elongated base having two rows of resilient conductive clamps positioned on the base and an elongated cover mounted on the base and having rows of openings correspondingly formed in the cover with respect to the conductive clamps. A push member is movably mounted between the cover and the base. A camming rod member is mounted between the cover and base for actuating the push member to depress the resilient conductive clamps, urging the resilient conductive clamps to contact the flat pins of the semiconductors when the flat pins are plugged into the socket. Each of the resilient conductive clamps has clamping faces parallel to the contacting faces of the flat pins of the semiconductor. The push member includes a pair of U-shaped members which are moved with respect to each other in a direction perpendicular to the contacting faces of the flat pins of the semiconductor by the camming rod member to enable the side plates to depress the clamping faces of the resilient conductive clamps to contact the contacting faces of the flat pins of the semiconductor.

REFERENCES:
patent: 3997227 (1976-12-01), Cutchaw
patent: 4314736 (1982-02-01), Demnianiuk
patent: 4375309 (1983-03-01), Griffin
patent: 4377319 (1983-03-01), MacDougall
patent: 4611870 (1986-09-01), Beers
patent: 4714879 (1987-12-01), Krause
patent: 4950980 (1990-08-01), Pfaff
patent: 5065941 (1991-11-01), Suzuki

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