Radiation imagery chemistry: process – composition – or product th – Diazo reproduction – process – composition – or product – Composition or product which contains radiation sensitive...
Patent
1990-03-29
1992-12-08
Bowers, Jr., Charles L.
Radiation imagery chemistry: process, composition, or product th
Diazo reproduction, process, composition, or product
Composition or product which contains radiation sensitive...
430165, 430167, 430193, 430197, 430270, 430325, 430326, 430330, 430907, 430942, 430945, 430966, G03F 7022, G03F 7023, G03F 7012, G03F 732
Patent
active
051697408
ABSTRACT:
Resist containing novolak prepared by condensating halogenated phenol represented by the following formula (III) and one or more phenol derivatives selected from the group consisting of cresol, xylenol, tet-butylphenol and propenylphenol, with a carbonyl compound ##STR1## wherein R.sub.3 is an halogen atom selected from the group consisting of F, Cl, and Br. If the resist is used as a positive-type one, it further contains a photo-sensitive agent, and R.sub.3 in the formula (III) is either F or Br. If the resist is used as a negative-type one, it further contains a photosensitive agent and/or a sensitizer, and R.sub.3 in the formula (III) is either Cl or Br.
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patent: 4642282 (1987-02-01), Stahlhofen
patent: 4842983 (1989-06-01), Hasegawa
patent: 4859563 (1989-10-01), Miura et al.
patent: 5023311 (1991-06-01), Kubota
Kumagae Akitoshi
Tada Tsukasa
Ushirogouchi Toru
Bowers Jr. Charles L.
Chu John S. Y.
Kabushiki Kaisha Toshiba
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