Dynamic information storage or retrieval – With servo positioning of transducer assembly over track...
Patent
1996-09-06
1998-09-15
Huber, Paul W.
Dynamic information storage or retrieval
With servo positioning of transducer assembly over track...
369127, 369128, 250306, G11B 700
Patent
active
058089772
ABSTRACT:
An object of the present invention is to provide a novel tracking method and device, suitable for use in a recording means applying the technology of a scanning probe microscope, for recording and/or reproducing high-density information of a size of several tens of nm or less at high speed and with high accuracy. The tracking method and device includes a recording medium having bumpy structures for tracking, which are formed on the surface thereof, a cantilever having a tip for writing in, reading out and erasing information, and means for detecting bending and torsion of the cantilever. Further, the tip and the recording medium are moved relative to each other in the direction in which a fixed end and a free end of the cantilever are coupled to each other, in a state in which the tip has been brought into proximity to or contact with the recording medium. In this state, the amount and direction of the torsion of the cantilever, or the amount of the bending thereof and the direction of the torsion thereof due to the bumpy structures are set as feedback signals so as to perform tracking.
REFERENCES:
patent: 5537372 (1996-07-01), Albrecht et al.
patent: 5610898 (1997-03-01), Takimoto et al.
Physical Review Letters, "Atomic Force Microscope" by G. Binning, et al vol. 56, No. 9, pp. 930-933 (1986).
"Novel optical approach to atomic force microscopy" by Gerhard Meyer, et al vol. 53, No. 12, pp. 1045-1047 (1988).
"Atomic resolution with an atomic force microscope using piezoresistive detection" by M. Tortonese, et al, vol. 62, No. 8, pp. 834-836 (1993).
"The atomic force microscopoe used as a powerful tool for machining surfaces" by T.A. Jung, et al, vol.42, No.44, pp. 1446-1451 (1992).
"Thermomechanical writing with an atomic force microscope tip" by H.J. Mamin, et al, vol.61, No. 8, pp. 1003-1005 (1992).
Hosaka Sumio
Imura Ryo
Koyanagi Hajime
Hitachi , Ltd.
Huber Paul W.
LandOfFree
Tracking method and recording means thereby does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Tracking method and recording means thereby, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Tracking method and recording means thereby will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-95801