Semiconductor integrated circuit device having burn-in test capa

Details Semiconductor integrated circuit device having burn-in test capa Semiconductor integrated circuit device having burn-in test capa

1997-08-05

1999-06-01

Callahan, Timothy P.

Miscellaneous active electrical nonlinear devices, circuits, and

Specific identifiable device, circuit, or system

With specific source of supply or bias voltage

327530, 327525, 327540, 327541, G05F 110

Patent

active

059091428

ABSTRACT:
A semiconductor integrated circuit device includes a flat-range voltage supply unit which steps down an external power supply voltage and generates a resultant, flat-range voltage, and a burn-in voltage supply unit which generates a burn-in voltage depending on the external power supply voltage. A switching unit selects either the flat-range voltage or the burn-in voltage, a selected voltage being supplied to an internal circuit. A switching instruction unit includes switches and generates a switching instruction signal by an ON/OFF control of the switches. A switching control unit controls the switching unit in accordance with the switching instruction signal.

REFERENCES:
patent: 4157480 (1979-06-01), Edwards
patent: 4158147 (1979-06-01), Edwards
patent: 5028821 (1991-07-01), Kaplinsky
patent: 5300824 (1994-04-01), Iyenger
patent: 5309399 (1994-05-01), Murotani
patent: 5334888 (1994-08-01), Bodas
patent: 5337272 (1994-08-01), Suwa et al.
patent: 5347170 (1994-09-01), Hayakawa et al.
patent: 5349290 (1994-09-01), Yamada
patent: 5396113 (1995-03-01), Park et al.
patent: 5426616 (1995-06-01), Kajigaya et al.
patent: 5428299 (1995-06-01), Koshikawa

Affiliated with

Also associated with

Rating

Semiconductor integrated circuit device having burn-in test capa does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor integrated circuit device having burn-in test capa, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit device having burn-in test capa will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-957315