Test circuit for screening parts

Details Test circuit for screening parts Test circuit for screening parts

1993-01-22

1994-08-16

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324765, 324767, 371 225, G01R 3128

Patent

active

053390288

ABSTRACT:
A test circuit (10) is connected to a package pin of an integrated circuit via the first node (16). By setting the voltage on the package pin to a sufficient voltage, the test circuit becomes operable to measure DC characteristics of devices in the test circuit. The DC characteristics of the test circuit devices, such as resistors (26 and 34), diodes (44) and transistors (30 and 32) are used to estimate the AC characteristics of the actual integrated circuit. The AC characteristic estimations may be used to screen parts into various speed classes.

REFERENCES:
patent: 3423677 (1969-01-01), Alford et al.
patent: 3585500 (1971-06-01), Grubel
patent: 4871963 (1989-10-01), Cozzi

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