Noise compensated interferometric measuring device and method us

Details Noise compensated interferometric measuring device and method us Noise compensated interferometric measuring device and method us

1995-05-18

1997-01-28

Turner, Samuel A.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356357, G01B 902

Patent

active

055982646

ABSTRACT:
A sensor and a method for using the sensor for precise measurement of displacement is disclosed. The sensor comprises a fringe tracking signal processing system which can be used with any type of interferometer to provide high resolution over a large dynamic range of motion. The signal processing is based on phase information from the interferometric signal and the sensor is not sensitive to amplitude changes.

REFERENCES:
patent: 4738527 (1988-04-01), McBrien
patent: 5208819 (1993-05-01), Huber
patent: 5412474 (1995-05-01), Reasenberg et al.
"Measurements of Ultrasmall Displacements", SPIE vol. 126, Jacobs, Aug. 1997, pp. 39-43.

Affiliated with

Also associated with

Rating

Noise compensated interferometric measuring device and method us does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Noise compensated interferometric measuring device and method us, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Noise compensated interferometric measuring device and method us will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-944761