Conductive pattern for electric test of semiconductor chips

Details Conductive pattern for electric test of semiconductor chips Conductive pattern for electric test of semiconductor chips

1989-01-23

1991-05-07

Wieder, Kenneth

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 324158R, 324158F, G01R 3102, G01R 3128

Patent

active

050140035

ABSTRACT:
A conductive pattern for electric test of a semiconductor chip with which probes are in contact is disclosed. The pattern has a plurality of probing pads for electric test and at least two unit continuity check patterns provided within an area for determining alignment of the probes with the probing pads. Each of the unit continuity check patterns has a plurality of conductive pads and a conductive line connecting the pads.

REFERENCES:
patent: 3781683 (1973-12-01), Freed
patent: 3974443 (1976-08-01), Thomas
patent: 4266191 (1981-05-01), Spano et al.
patent: 4386459 (1983-06-01), Boulin
patent: 4801869 (1989-01-01), Sprogis

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