1991-03-01
1992-06-23
Davie, James W.
357 237, H01L 2978
Patent
active
051247690
ABSTRACT:
The thin film transistor comprises source and drain regions, a channel forming region formed between the source and drain regions, a first (main) gate for turning on or off the transistor, and in particular at least one second (sub-) gate for reducing turn-off leakage current. When the n-channel transistor is turned off, for example, a negative voltage is applied to the main gate to form a p-channel layer in the channel forming region under the main gate and a positive voltage is applied to the subgate to form an n-channel layer in the channel forming region under the subgate, for instance, so that a pn junction can be formed between under the main gate and the subgate to reduce the turn-off leakage current. The above-mentioned disclosure can be clearly applied to p-channel transistors. Further, the above four-terminal transistor can be simply modified to a three-terminal transistor by connecting the main gate to the subgate via a diode or a capacitor or by directly connecting the drain region to the subgate. Further, the above three-terminal transistor can be manufactured in accordance with only the ordinary device manufacturing process.
REFERENCES:
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Patent Abstracts of Japan, vol. 7, No. 214 (E-199)(1359) Sep. 21, 1983, & JP-A-58 107676 (Nippon Denki K.K.) Jun. 27, 1983.
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Patent Abstracts of Japan, vol. 10, No. 263 (E-435)(2319) Sep. 9, 1986, & JP-A-61 88565 (Sony Corp.), May 6, 1986.
Kato Kinya
Nakazawa Kenji
Suyama Shiro
Tanaka Keiji
Davie James W.
Nippon Telegraph and Telephone Corporation
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