Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1978-02-06
1980-05-13
Corbin, John K.
Optics: measuring and testing
By polarized light examination
With light attenuation
356374, 356376, 356429, G01B 1124
Patent
active
042026300
ABSTRACT:
A slit image extending in the lateral direction of a travelling object is projected onto the surface of the object from one direction by means of a projection lens. The slit image formed on the object is then projected by means of an image focusing optical system onto a grid to make a light section moire element. The optical axis of the image focusing optical system is different from that of the projection lens employed in the slit image forming optical system. The light section moire element is enlarged in the lateral direction by means of a condenser lens and an anamorphic lens and focused on another slit. Behind the slit is located a film to record a line of light spots which represent the surface irregularity of the object. The film is fed in synchronization with the travel of the object so that the surface irregularities of the object may be recorded on the film in the form of contour lines.
REFERENCES:
patent: 3043910 (1962-07-01), Hicks
patent: 3614237 (1971-10-01), Kyle et al.
patent: 3907438 (1975-09-01), Holeman
patent: 4102578 (1978-07-01), Suzuki et al.
Suzuki Kiyoshi
Suzuki Masane
Baker Joseph J.
Corbin John K.
Ferguson Jr. Gerald J.
Fuji Photo Optical Co., Ltd.
Rosenberger R. A.
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