Semiconductor probe card for low current measurements

Details Semiconductor probe card for low current measurements Semiconductor probe card for low current measurements

1996-06-07

1998-09-15

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, G01R 104

Patent

active

058084754

ABSTRACT:
A semiconductor probe card is provided with low dielectric absorption feed-through contacts to isolate test lines from printed circuit board leakage effects.

REFERENCES:
patent: 3866119 (1975-02-01), Ardezzone et al.
patent: 4056777 (1977-11-01), Roch
patent: 4488111 (1984-12-01), Widdowson
patent: 4518914 (1985-05-01), Okubo et al.
patent: 4899106 (1990-02-01), Ogura
patent: 4983907 (1991-01-01), Crowley
patent: 5345170 (1994-09-01), Schwindt et al.
patent: 5434512 (1995-07-01), Schwindt et al.
patent: 5457398 (1995-10-01), Schwindt et al.

Affiliated with

Also associated with

Rating

Semiconductor probe card for low current measurements does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor probe card for low current measurements, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor probe card for low current measurements will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-92198