System and method for detecting and locating flaws on or beneath

Details System and method for detecting and locating flaws on or beneath System and method for detecting and locating flaws on or beneath

1993-04-08

1994-12-27

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Distributive type parameters

324632, 324642, 324533, 73601, 73628, G01R 2704

Patent

active

053768892

ABSTRACT:
A parallel plate transmission line (20) is formed by conformal application of one or more dielectric and conductive layers to the surface under test (70). A signal generator (42) is employed to transmit variable frequency signals (60) along the transmission line (20). Discontinuities in the transmission line (20) cause reflections (62) which are received by a receiver (48). A processor (44) coupled to the signal generator (42) and receiver (48) detects and locates the discontinuities.

REFERENCES:
patent: 3710243 (1973-01-01), Keenan
patent: 3715667 (1973-02-01), Nicolson
patent: 3753086 (1973-08-01), Shoemaker
patent: 4123703 (1978-10-01), Robinson
patent: 4354388 (1982-10-01), Diepers
patent: 4509369 (1985-04-01), Kuljis
patent: 4520308 (1985-05-01), Rohde
patent: 4634963 (1987-01-01), Lunden
patent: 5185579 (1993-02-01), Mertens
Tiuri: "A microwave instrument for measurement of small in homogenerties . . . "--Journal of Microwave Power--Jun. 1974.

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