Patent
1988-04-20
1989-09-12
Mintel, William A.
357 42, 357 236, 357 237, 357 54, 357 59, 357 51, H01L 2714
Patent
active
048664987
ABSTRACT:
The sensitivity of an integrated circuit to single-event upsets is decreased by providing a dissi
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Chafin James H.
Hightower Judson H.
Libman George H.
Mintel William A.
The United States Department of Energy
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