Method for forming vertical transistor structures having bipolar

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437 40, 437 59, 437 89, 437915, H01L 21265

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053765621

ABSTRACT:
A transistor is formed as either a bipolar transistor (10) or an MOS transistor (11). Each transistor (10 or 11) has a substrate (12). Bipolar transistor (10) has a first current electrode (26) underlying a control electrode (28), and a second current electrode (32) overlying the control electrode (28). MOS transistor (11) has a first current electrode (54) underlying a channel region (56), and a source lightly doped region (58) and a source heavily doped region (60) overlying the channel region (56). A control electrode conductive layer (40) is laterally adjacent a sidewall dielectric layer (48), and sidewall dielectric layer (48) is laterally adjacent channel region (56). Conductive layer (40) functions as a gate electrode for transistor (11). Each of the transistors (10 and 11) is vertically integrated such as in a vertically integrated BiMOS circuit. Transistors (10 and 11) can be electrically isolated by isolation ( 64 and 66).

REFERENCES:
patent: 2898454 (1959-08-01), Loughlin
patent: 4467518 (1984-08-01), Bansal et al.
patent: 4554570 (1985-11-01), Jastrzebski et al.
patent: 4603468 (1986-08-01), Lam
patent: 4609407 (1986-09-01), Masao et al.
patent: 4651408 (1987-03-01), MacElwee et al.
patent: 4656731 (1987-04-01), Lam et al.
patent: 4740826 (1988-04-01), Chatterjee
patent: 4849371 (1989-07-01), Hansen et al.
patent: 4851362 (1989-07-01), Suzuki
patent: 4902637 (1990-02-01), Kondou et al.
patent: 4902641 (1990-02-01), Koury, Jr.
patent: 4997785 (1991-03-01), Pfiester
patent: 5096844 (1992-03-01), Konig et al.
patent: 5100817 (1992-03-01), Cederbaum et al.
patent: 5122476 (1992-06-01), Fazan et al.
patent: 5155058 (1992-10-01), Fujiwara et al.
patent: 5156987 (1992-10-01), Sandhu et al.
patent: 5192705 (1993-03-01), Itoh
patent: 5208172 (1993-05-01), Fitch et al.
patent: 5252849 (1993-10-01), Fitch et al.
"Impact of Surrounding Gate Transistor (SGT) for Ultra-High-Density LSI's", by Hiroshi Takato et al., was published in IEEE Trans. on Electron Devices, vol. 38, No. 3, Mar. 1991, pp. 573-577.
Drangeid, "High-Speed Field Effect Structure," IBM Technical Disclosure Bulletin, Aug. 1968, vol. 11, No. 3, pp. 332-333.

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