Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1994-05-25
1996-03-26
Regan, Maura K.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324550, 327525, G01R 2708, G01R 3102, H01H 3776
Patent
active
055023959
ABSTRACT:
A method for programming antifuses is described. Programming current pulses are driven through a selected antifuse. The resistance through the antifuse is then measured and compared to a predetermined resistance value. These measuring, comparing and driving steps are repeated until the measured resistance is less than a predetermined resistance value and the antifuse is annealed by driving a predetermined amount of current through the antifuse for a first predetermined amount of time and ramping down the current in a predetermined manner in a second predetermined amount of time. With this programming method no complex methods and circuits to reverse the polarities of voltage across and currents through the antifuse are required.
REFERENCES:
patent: 4700130 (1987-10-01), Bloemen
patent: 4701636 (1987-10-01), Millhollan et al.
patent: 5126282 (1992-06-01), Chiang et al.
patent: 5194759 (1993-03-01), El-Ayat et al.
patent: 5272388 (1993-12-01), Bakker
patent: 5293133 (1994-03-01), Birkner et al.
patent: 5341043 (1994-08-01), McCollum
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