Radiant energy – Luminophor irradiation
Patent
1995-06-16
1998-09-15
Anderson, Bruce
Radiant energy
Luminophor irradiation
250307, H01J 3730
Patent
active
058083111
ABSTRACT:
Atomic displacement on a material surface is detected by, in a system comprising the tip of a scanning tunneling microscope (STM) and a material in question, upon an atomic displacement operation comprising extraction of atoms on the material surface and adsorption of atoms onto the material surface through application of a pulse voltage to the tip of STM, measuring a z-piezo voltage along the time series during and after application of the pulse voltage. Furthermore, heteroatoms dissociated by a reaction between the tip surface of STM and heteromolecules in a heteromolecular atmosphere are stored on the surface of the tip of STM, and then, heteroatoms are locally adsorbed onto the material surface by causing electro-evaporation of the heteroatoms through application of a prescribed scanning voltage to the tip of STM.
REFERENCES:
patent: 4987312 (1991-01-01), Eigler
patent: 5043578 (1991-08-01), Guethner et al.
patent: 5166919 (1992-11-01), Eigler
patent: 5397420 (1995-03-01), Sakakibara et al.
patent: 5416331 (1995-05-01), Ichikawa et al.
patent: 5440122 (1995-08-01), Yasutake
patent: 5471064 (1995-11-01), Koyanagi et al.
patent: 5489339 (1996-02-01), Hattori
"Surface Studies by Scanning Tunneling Microscopy", G. Binning et al., The American Physical Society, Physical Review Letters, vol. 49, No. 1., pp. 57-61, Apr. 30, 1982.
"Nanometer Lithography with the Scanning Tunneling Microscope", M. Ringger et al., American Institute of Physics, Appl. Phys. Letter 46, pp. 832-834, May 1, 1985.
"Surface Diffusion of Oxygen Atoms Individually Observed by STM", G. Binning et al., IBM Zurich Research Laboratory, Surface Science 169, pp. L295-L300, 1986.
"Nanometer Scale Structure Fabrication with the Scanning Tunneling Microscope", U. Staufer et al., American Institute of Physics, Appl. Phys. Letter 51, pp. 244-246, Jul. 27, 1987.
"Transition from the Tunneling Regime to Point Contact Studies Using Scanning Tunneling Microscopy", J. K. Gimzewski et al. The American Physical Society, Physical Review B, vol. 36, No. 2, pp. 1284-1287, Jul. 15, 1987.
"Atomic-Scale Surface Modifications Using a Tunneling Microscope", R.S. Becker et al., AT&T Bell Laboratories, Letters to Nature, vol. 325, pp. 419-421, Jan. 29, 1987.
"Characterization of Gold Surfaces for Use as Substrates in Scanning Tunneling Microscopy Studies", R. Emch et al., American Institute of Physics, J. Appl. Phys. 65, pp. 79-84, Jan. 1, 1989.
"Writing Nanometer-Scale Symbols in Gold Using the Scanning Tunneling Microscope", Y.Z. Li et al., American Institute of Physics, Appl. Phys. Letter 54, pp. 1424-1426, Apr. 10, 1989.
"Atomic Emission from a Gold Scanning-Tunneling Microscope Tip", H.J. Mamin et al., The American Physical Society, Physical Review Letters, vol. 65, No. 19, pp. 2418-2421, Nov. 5, 1990.
"Atomic and Molecular Manipulation with the Scanning Tunneling Microscope", J.A. Stroscio et al., IBM Research Division, Science, vol. 254, pp. 1319-1326, Nov. 29, 1991.
"Field-Induced Nanometer to Atomic-Scale Manipulation of Silicon Surfaces with the STM", In-Whan Lyo et al., IBM Research Division, Science, vol. 253, pp. 173-176, Jul. 12, 1991.
"Atomic Sites of a Bare Surface Modified with the Tunneling Microscope", H. Fuchs et al., Advanced Materials, Adv. Mater. 3, No. 2, pp. 112-113, 1991.
"Tailoring Nanostructures with a Scanning Tunneling Microscope", U. Staufer et al., American Vacuum Society, J. Vac. Sci. Technol. B9 (2), pp. 1389-1393, Mar./Apr. 1991,
"An Atomic Switch Realized with the Scanning Tunneling Microscope", Nature, Letters to Nature vol. 352, pp. 600-603, Aug. 15, 1991.
"Surface Modification of MoS.sub.2 Using an STM", Shigeyuki Hosoki et al., Applied Surface Science, vol. 60/61, pp. 643-647, 1992.
"Fabrication of Atomic-Scale Structures on Si(111)-7.times.7 Using a Scanning Tunneling Microscope (STM)", Dehuan Huang et al., American Institute of Physics, Jpn.J.Appl.Phys. vol. 31, Part 1, No. 12B, pp. 4501-4503, Dec. 1992.
"Site-Specific Measurement of Adatom Binding Energy Differences by Atom Extraction with the STM", Hironaga Uchida et al., The American Physical Society, Physical Review Letters, vol. 70, No. 13, pp. 2040-2043, Mar. 29, 1993.
"Formation of Nanometer-Scale Grooves in Silicon with a Scanning Tunneling Microscope", A. Kobayashi et al., Science, Reports, vol. 259, pp. 1724-1726, Mar. 19, 1993.
Aono Masakazu
Grey Francois
Huang Dehuan
Kobayashi Ataru
Kuramochi Hiromi
Anderson Bruce
Research Development Corporation of Japan
LandOfFree
Method for detecting displacement of atoms on material surface a does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for detecting displacement of atoms on material surface a, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for detecting displacement of atoms on material surface a will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-91075