Patent
1991-02-13
1992-10-27
James, Andrew J.
357 233, 357 235, 357 2314, H01L 2934, H01L 2910, H01L 2968, H01L 2992
Patent
active
051594315
ABSTRACT:
A source diffusion region and a drain diffusion region are formed under an insulation film which is thicker than a gate insulation film and which isolates the adjacent channel regions from each other. The adjacent source and drain diffusion regions are isolated from each other by a trench which extends from the central portion of the thick insulation film to the interior of a semiconductor substrate. The trench is formed in a self-alignment manner with reference to the end portions of the adjacent floating gate electrodes, and the depth of this trench is determined so that the adjacent source and drain diffusion regions can be spaced sufficiently apart from each other. Since the trench reliably prevents punch-through and current leakage to the adjacent element, it is possible to remarkably reduce the cell size. Moreover, the peripheral circuits are not complicated since the functions of the source and drain regions are fixed.
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James Andrew J.
Kabushiki Kaisha Toshiba
Russell Daniel N.
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