Ophthalmic examination apparatus

Details Ophthalmic examination apparatus Ophthalmic examination apparatus

1988-08-22

1989-08-08

Bovernick, Rodney B.

Optics: eye examining, vision testing and correcting

Eye examining or testing instrument

Objective type

351206, A61B 310

Patent

active

048546925

ABSTRACT:
Disclosed is an ophthalmic examination apparatus in which a laser beam is deflected at an eye fundus under examination to scan the eye fundus two-dimensionally, and light reflected back from the eye fundus is detected for photoelectric conversion to obtain information about the eye fundus. The apparatus includes a first optical deflector for deflecting the laser beam to scan the eye fundus in one direction and a second optical deflector for deflecting the laser beam to scan the eye fundus in a direction perpendicular to the scanning direction of the first optical deflector. A detection slit is provided which extends perpendicularly to the scanning direction of the second optical deflector and which is disposed at a position optically conjugate with the eye fundus. The reflected light is deflected in a direction parallel to the detection slit, but stationary in a direction that is perpendicular to the slit. The slit serves to remove unrequired scattered light from the optical system for examining the eye.

REFERENCES:
patent: 4213678 (1980-07-01), Pomerantzeff et al.
patent: 4768874 (1988-09-01), Webb et al.
patent: 4781453 (1988-11-01), Kobayashi

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