Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Patent
1996-12-31
1998-11-17
Voeltz, Emanuel Todd
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
702 58, 36452827, 36452828, 36452829, 361 65, 361 63, 361 79, 361 80, 324525, H02H 326
Patent
active
058390936
ABSTRACT:
Both fault location and fault resistance of a fault are calculated by the present method and system. The method and system takes into account the effects of fault resistance and load flow, thereby calculating fault resistance by taking into consideration the current flowing through the distribution network as well as the effect of fault impedance. A direct method calculates fault location and fault resistance directly while an iterative fashion method utilizes simpler calculations in an iterative fashion which first assumes that the phase angle of the current distribution factor D.sub.s is zero, calculates an estimate of fault location utilizing this assumption, and then iteratively calculates a new value of the phase angle .beta..sub.s of the current distribution factor D.sub.s and fault location m until a sufficiently accurate determination of fault location is ascertained. Fault resistance is then calculated based upon the calculated fault location. The techniques are equally applicable to a three-phase system once fault type is identified.
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Hart David
Hu Yi
Myllymaki Jorma
Novosel Damir
ABB Transmit Oy
Todd Voeltz Emanuel
Wachsman Hal D.
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