Patent
1995-11-28
1998-11-17
Voeltz, Emanuel Todd
G06F 945
Patent
active
058389768
ABSTRACT:
A profiler that accurately measures performance metrics for all threads executing a process on a SMP computer system. The profiler uses dynamic instrumentation to cause threads to sample performance metrics before and after certain code regions. In addition, the profiler uses extensions to a parallel support layer to register a parent thread with its child threads. Each thread stores the measured performance metric, or delta, in a memory cell or cells corresponding to its region and its parent region. When the process is complete, the profiler scans through the memory storage areas and sums the deltas for each particular level of code. Then, the results may be analyzed at the thread or process level. In this manner, the profiler can be adapted to work with any process executing on the computer system.
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Corcoran, III Peter J.
Hewlett-Packard Co.
Todd Voeltz Emanuel
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