Apparatus for testing circuits within a system

Details Apparatus for testing circuits within a system Apparatus for testing circuits within a system

1982-09-30

1985-11-19

Chin, Gary

Boots, shoes, and leggings

324 73AT, 364489, G01R 3100

Patent

active

045546363

ABSTRACT:
A capability for internal self-testing is provided for a test instrument in which data, in digital and in analog form, is sampled from various test points. A programmable delay generator is used to process some of the data and to provide strobes which control the data output and which control the sampling of data. This enables measurements to be made at a preselected time after the occurrence of a particular signal, thereby giving the system a capability of using the delay generator not only for providing comparisons of time functions but also for initiating test sub-routines.
The self-test capability enables test equipment having time-dependent functions, such as test equipment for video displays, to be verified with respect to accuracy in order to establish a confidence test.

REFERENCES:
patent: 3651315 (1972-03-01), Collins
patent: 4135209 (1979-01-01), Logan
patent: 4270178 (1981-05-01), Lillig
patent: 4466014 (1984-08-01), Wilensky et al.

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