Testing procedure and circuit for the determination of frequency

Details Testing procedure and circuit for the determination of frequency Testing procedure and circuit for the determination of frequency

1978-05-30

1981-04-28

Atkinson, Charles E.

Boots, shoes, and leggings

364485, 364718, 364726, 324 57DE, 455 67, 1791753R, G01R 2728, H04B 346

Patent

active

042649595

ABSTRACT:
In testing to determine frequency distortions and group delay time distortions of a test object in a telecommunication link, a test pulse is introduced and its distortion caused by the test object is evaluated, which determination is specifically indicated in that the test pulse consist of a number of preselected oscillations, with respect to amplitude and phase of different frequencies, and that the return pulse is processed with the help of Fourier analysis and the individual frequency components are analyzed with respect to amplitude and phase relationship with respect to each other.

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"Transfer Function Measurement Using Fast Pulses" by R. C. French, Published in Electronic Engineering, Aug., 1966, pp. 516-519.
"Measuring Waveform Distortion with a Par Meter" By W. T. Cochran, Published in Bell Lab Record, Oct., 1965, pp. 369-371.
CCITT Recommendation, Recommendation 0.81, vol., IV. 2, pp. 44-50.

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