Distributed pattern generator

Details Distributed pattern generator Distributed pattern generator

1983-12-19

1987-01-27

Atkinson, Charles E.

Excavating

324 73R, 371 20, G01R 3128

Patent

active

046399194

ABSTRACT:
An array testing apparatus includes a plurality of pin pattern generators for individually generating serial bit sequences required at each pin of a device under test during the testing operation. The individual pin pattern generators receive starting addresses from one or more programmable controllers and each pin pattern generator then performs a subroutine to repeat basic patterns or combinations of basic patterns as necessary. Both the pin pattern generators and the programmable controllers may include loop logic for obtaining the desired repetition sequences.

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