Plasma source mass spectrometer

Details Plasma source mass spectrometer Plasma source mass spectrometer

1989-11-07

1990-10-16

Berman, Jack I.

Radiant energy

Ionic separation or analysis

With sample supply means

250281, H01J 4912

Patent

active

049637355

ABSTRACT:
A plasma source mass spectrometer in which ions in a plasma generated in a high pressure (.ltoreq.1 atm) region are introduced into a low pressure (.ltoreq.10.sup.-5 Torr) region to analysis the ion mass includes a moderate pressure (.gtoreq.10.sup.-3 Torr) region which is provided between the high pressure region and the low pressure region. The plasma generated in the high pressure region is diffused to the moderate pressure region in order to produce a diffused plasma. Ions are extracted from the diffused plasma by an ion extraction electrode having an ion extraction opening. In the vicinity of the ion extraction opening a convex-shaped toward the diffused plasma whereby ion sheath is formed, whereby the ions can be extracted toward the low pressure region with a high efficiency.

REFERENCES:
patent: 4287419 (1981-09-01), Booth
Olivares et al., Analytical Chemistry, 57, 13 (1985), pp. 2674-2679.
Date et al., Analyst, vol. 108, Feb. 1983, pp. 159-165.

Affiliated with

Also associated with

Rating

Plasma source mass spectrometer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Plasma source mass spectrometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Plasma source mass spectrometer will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-851111