Method and apparatus for measuring the electrical properties of

Details Method and apparatus for measuring the electrical properties of Method and apparatus for measuring the electrical properties of

1990-03-19

1991-12-17

Harvey, Jack B.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Distributive type parameters

324642, 333161, G01N 2200

Patent

active

050737554

ABSTRACT:
A dielectric test device formed on a substrate which includes a conductive ground plane layer formed over the substrate, a dielectric layer over the ground plane layer and a short and long conductive strip overlying the dielectric layer. Each of the long and short strips extends between common input and output conductive pads and are substantially identical in all respects except for length. Measurement of the interference pattern at the output node resulting from an input signal of a single frequency applied to the input node as frequency is varied over the gigahertz range allows the calculation of effective dielectric constant, propagation velocity as a function of frequency and attenuation.

REFERENCES:
patent: 3388327 (1968-06-01), Sutton et al.
patent: 3796976 (1974-03-01), Heng et al.
patent: 4123703 (1978-10-01), Robinson
patent: 4520308 (1985-05-01), Rohde et al.
patent: 4616196 (1986-10-01), Sharma
patent: 4866370 (1989-09-01), Flemming et al.
patent: 4942373 (1990-07-01), Ozawa et al.
Das et al., Two Methods for the Measurement of Substrate Dielectric Constant, 7-1987, IEEE Trans. on Micro. Theory and Tech., vol. MTT-35, No. 7, pp. 636-642.

Affiliated with

Also associated with

Rating

Method and apparatus for measuring the electrical properties of does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for measuring the electrical properties of , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring the electrical properties of will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-837387