Method and apparatus for testing LCD panel array using a magneti

Details Method and apparatus for testing LCD panel array using a magneti Method and apparatus for testing LCD panel array using a magneti

1990-07-24

1991-12-17

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

340784, G01R 3128, G09G 330

Patent

active

050737546

ABSTRACT:
An LCD panel or the like is tested by determining whether any short circuit defects are present. The panel is tested for short circuit defects by scanning gate lines and drive lines with a magnetic field pickup device while a current is applied to a shorting bar which shorts together a plurality of gate lines or a plurality of drive lines. When a short circuit defect is present, a current flows through the shorted area. As a result, a corresponding magnetic field is generated along the involved lines. For a cross-short defect, the location of the defect is identified as the intersection of the drive line and gate line which generate magnetic fields of substantially the same strength.

REFERENCES:
patent: 3992663 (1976-11-01), Seddick
patent: 4507605 (1985-03-01), Geisel
patent: 4542333 (1985-09-01), Koontz
patent: 4633242 (1986-12-01), Sekiya
Wisnieff et al., "In-Process Testing of Thin-Film Transistor Arrays" SID 90 Digest pp. 190-193.
"Unsurpassed Technology Resources, and Commitment Make Hitachi Your Best LCD Partner".
Luo et al., "Testing and Qualifications of a-Si TFT-LC Color Cells for Military Avionics Applications" SID 90 Digest pp. 194-196.
Becker et al., "Measurement of Electro-Optic Characteristics of LCDs" SID 90 Digest pp. 163-166.

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