Method of manufacturing MIS semiconductor device

Fishing – trapping – and vermin destroying

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437 29, 437 35, 437 41, 437238, 357 233, H01L 21265, H01L 21336

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active

050735144

ABSTRACT:
This invention discloses a method of manufacturing a MIS semiconductor device having at least a portion of a drain region which contacts a channel and has a relatively low impurity concentration to obtain an LDD structure, wherein an insulating film is formed on at least a surface of a semiconductor substrate or double side walls are formed on a gate electrode, the surface is oxidized, and in this state, an impurity region having a relatively high impurity concentration is formed to manufacture a MIS semiconductor device having excellent characteristics at a high yield.

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Tsang et al., "Fabrication of High Performance LDDFET's with Oxide Sidewall--Spacer Technology", IEEE Trans. on Electron Devices, vol. ED--29, No. 4, Apr. 1982, pp. 590-596.

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