Image analysis – Histogram processing – For setting a threshold
Patent
1983-10-04
1985-06-04
Boudreau, Leo H.
Image analysis
Histogram processing
For setting a threshold
382 14, 382 34, G06K 970
Patent
active
045219095
ABSTRACT:
A pattern recognition system has both coarse and fine levels of analysis in which a coarse array representation of a workpiece pattern is formed and used to identify the workpiece pattern as either a referench character or as a member of an ambiguous set of reference characters which are represented by identical coarse array representations. At least portions of a fine array representation of a workpiece pattern which has been classified as a member of a set of reference characters are compared to corresponding portions of fine array representations of reference characters in the set identified by the classification. The pattern recognition system has a learning system through which reference characters may be introduced into the recognition system and through which a representation of a workpiece pattern which was not identified may be incorporated into an existing set of reference characters of the recognition system.
REFERENCES:
patent: 3182290 (1965-05-01), Rabinow
patent: 3829831 (1974-08-01), Yamamoto et al.
patent: 3967241 (1976-06-01), Kawa
patent: 4027284 (1977-05-01), Hoshino et al.
Yamamoto et al., "Chinese Char. Rec. by Hierarchical Pattern Matching", Proc. of the 1st Int. Conf. on Pattern Rec., Oct. 1973, pp. 187-196.
Boudreau Leo H.
Milik Kenneth L.
Shanahan Michael H.
Wang Laboratories, Inc.
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