Test method for LCD elements

Details Test method for LCD elements Test method for LCD elements

1988-03-29

1989-06-27

Tokar, Michael J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

250310, G01R 3126

Patent

active

048433128

ABSTRACT:
Picture electrodes of an LCD semi-manufactured product in which normal addressing is not possible are scanned by means of an electron beam (7) in order to test the associated switching elements (13, 20). In a different type of LCD semi-manufactured product the quality of the switching elements (23, 24) can be monitored by means of irradiation with a laser beam (5).

REFERENCES:
patent: 3969670 (1976-07-01), Wu
patent: 4169244 (1979-09-01), Plows
patent: 4296372 (1981-10-01), Feuerbaum
patent: 4404635 (1983-09-01), Flaker
patent: 4415851 (1983-11-01), Langner
patent: 4471302 (1984-09-01), Fazekas
patent: 4573008 (1986-02-01), Lischke
patent: 4577147 (1986-03-01), Frosien
patent: 4578279 (1986-03-01), Zingher
patent: 4609867 (1986-09-01), Schink
patent: 4629898 (1986-12-01), Orloff
patent: 4644264 (1987-02-01), Beha
patent: 4721910 (1988-01-01), Bokor
patent: 4745360 (1988-05-01), Reimer
patent: 4755746 (1988-07-01), Mallory

Affiliated with

Also associated with

Rating

Test method for LCD elements does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test method for LCD elements, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test method for LCD elements will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-815907