Fabrication method for high power MOS device

Metal working – Method of mechanical manufacture – Assembling or joining

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

29578, 29580, 29591, 156648, 357 23, 357 55, 357 59, H01L 21467

Patent

active

043983391

ABSTRACT:
This disclosure relates to a high power VMOS semiconductor device and fabrication method therefor. This VMOS semiconductor device uses a doped polysilicon gate electrode in the V groove and an overlying metal electrode located over an insulation layer protecting the doped polysilicon gate electrode. This overlying metal electrode layer covers substantially the entire surface area (except for a small area where electrical contact is made to the doped polysilicon gate electrode) of one surface of the device. Another embodiment discloses the use of a self-aligned metal contact to the source or drain region of the VMOS device between adjacent V groov

REFERENCES:
patent: 3993515 (1976-11-01), Reichert
patent: 4048649 (1977-09-01), Bohn
patent: 4065783 (1977-12-01), Ouyang
patent: 4070690 (1978-01-01), Wickstrom
patent: 4105475 (1978-08-01), Jenne
patent: 4222063 (1980-09-01), Rodgers
Rodgers et al., "VMOS Memory Technology" 1977 IEEE International Solid-State Circuits Conf., Digest of Techn. Papers, pp. 74, 75, 239.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Fabrication method for high power MOS device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Fabrication method for high power MOS device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fabrication method for high power MOS device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-807959

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.