Fishing – trapping – and vermin destroying
Patent
1987-06-23
1988-09-13
Hearn, Brian E.
Fishing, trapping, and vermin destroying
437192, 437184, 437194, 437229, 437944, 437948, 437245, 148DIG143, 148DIG137, 148DIG106, 148DIG104, 148DIG100, H01L 21285, H01L 3922
Patent
active
047710179
ABSTRACT:
An improved patterning process, useful for the metallization of highly efficient photovoltaic cells, the formation of X-ray lithography masks in the sub half-micron range, and in the fabrication of VLSI and MMIC devices, is disclosed. The improved patterning process includes the steps of providing a substrate with a photoactive layer, patterning the photoactive layer with an inclined profile, depositing on both the substrate and the patterned photoactive layer a layer of disjointed metal such that the thickness of the metal layer exceeds that of the patterned photoactive layer and that the metal layer deposited on the substrate is formed with walls normal to the surface of the substrate. Preferably, the deposition of the disjointed metal layer is effected by evaporative metallization in a direction normal to the surface of the substrate. The deposited metal layer on the substrate is characterized by a high aspect ratio, with a rectangular cross section.
REFERENCES:
patent: 3898353 (1975-08-01), Napoli et al.
patent: 4029562 (1977-06-01), Feng et al.
patent: 4104070 (1978-08-01), Moritz et al.
patent: 4145459 (1979-03-01), Goel
patent: 4241109 (1980-12-01), Johnson
patent: 4378383 (1983-03-01), Moritz
patent: 4398341 (1983-08-01), Geipel, Jr. et al.
patent: 4414738 (1983-11-01), Jelks et al.
patent: 4450033 (1984-05-01), Little
patent: 4525919 (1985-07-01), Fabian
patent: 4536942 (1985-08-01), Chao et al.
patent: 4539222 (1985-09-01), Anderson, Jr. et al.
patent: 4599790 (1986-07-01), Kim et al.
patent: 4604292 (1986-08-01), Evans et al.
"Photoresist Image Reversal for Better Slope Control," Microelectronic Mfg. & Testing, Aug. 1985, pp. 28-29.
Helmut Klose et al., "Image Reversal of Positive Photoresist: Characterization & Modeling," IEEE Transactions, V. Ed-32, No. 9, Sep. '85; pp. 1654-1661.
A. R. Shimkunas, "Advances in X-Ray Mask Technology," Solid State Technology/Sep. 1984; pp. 192-199.
Holger Moritz, "Optical Single Layer Lift-Off Process," IEEE Transactions v. Ed-32, No. 3, Mar. 1985, pp. 672-676.
J. F. Allisor et al., "Microlithographic Techniques for High Speed Gates FETS," Solid State Technology, Jun. 1986, pp. 169-175.
P. A. Iles, "A Survey of Grid Technology," 16th IEEE Photovoltaic Spec. Confr., Sep. 1982, pp. 340-347.
R. P. Jaeger et al., "Linewidth Control in X-Ray Lithography: the Influence of the Penumbral Shadow," SPIE vol. 471, pp. 110-120.
A. R. Shimkunas et al., "X-Ray Mask Technology," SPIE vol. 537, pp. 206-212.
G. E. Georgiou et al., "DC Electroplating of Sub-Micron Gold Patterns on X-Ray Masks," SPIE vol. 471, pp. 96-102.
J. G. Werker, "26% Efficient GaAs Concentrator Cells," Sandia Report, SAND85-0791/1, May 1985, pp. 160-164.
M. A. Green et al., "23.6% Efficient Low Resistivity Silicon Concentrator Solar Cell," App. Phys. Lett. 49(4) Jul. 28, 1986, pp. 194-195.
J. M. Gee et al., "A GaAs/Si Mechanically Stacked, Multijunction Solar Cell," 1985 IEEE, pp. 546-551.
R. A. Sinton et al., "27.5% Si Concentrator Solar Cells," IEEE, vol. Edl-7, No. 10, Oct. 1986, pp. 567-569.
M. J. O'3 Neill et al., "Two Entech Concentrator Modules: etc," Sandia Report SAND86-0058/1, pp. 173-182.
IBM Technical Disclosure Bulletin, "Image Reversal Lift-Off Process Using a Release Layer", vol. 29, No. 11, Apr. 1987, p. 4935.
Spitzer Mark B.
Tobin Stephen P.
Hearn Brian E.
Pawlikowski Beverly Ann
Spire Corporation
LandOfFree
Patterning process does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Patterning process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Patterning process will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-806853