Pattern memory circuit for integrated circuit testing apparatus

Details Pattern memory circuit for integrated circuit testing apparatus Pattern memory circuit for integrated circuit testing apparatus

1992-03-16

1994-07-05

Harvey, Jack B.

Boots, shoes, and leggings

371 211, 371 212, 371 213, 371 3, G05B 1902, G11C 700, G11C 800

Patent

active

053273630

ABSTRACT:
A pattern memory circuit for an integrated circuit testing apparatus. The time consumed for diagnosis in the conventional testing apparatus which uses a CPU is reduced by performing test pattern memory checking using hardware in accordance with the present invention. The test pattern file in a pattern memory escapes from the area to be tested to another area of the pattern memory and the test is performed and upon completion of the test the file returns to the original area.

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