Image analysis – Histogram processing – For setting a threshold
Patent
1991-11-27
1994-03-29
Boudreau, Leo H.
Image analysis
Histogram processing
For setting a threshold
356360, 348126, G06K 900
Patent
active
052992683
ABSTRACT:
The detection (e.g., mapping) of metallized features (14,16) on a surface (12) of a substrate (10), such as a printed circuit board, is accomplished by separately spanning the surface with first and second lines of light (30,32), which have known intensity profiles which, when normalized, spatially intersect. As each line of light is spanned across the surface (12), the light reflected from a successive one of a plurality of very thin strips, each distant from the intersection of the intensity profiles, is sensed. The ratio of the sensed intensity of the light reflected when the surface (12) is spanned by the first line of light to the second line of light is computed. For each successively imaged strip at which the ratio of the sensed intensities exceeds a predetermined threshold, there is metallization present.
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AT&T Bell Laboratories
Boudreau Leo H.
Johns Andrew W.
Levy Robert B.
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