Fishing – trapping – and vermin destroying
Patent
1992-02-21
1994-03-29
Chaudhuri, Olik
Fishing, trapping, and vermin destroying
156613, 437 95, H01L 21205
Patent
active
052984524
ABSTRACT:
A method and apparatus for depositing single crystal, epitaxial films of silicon on a plurality of substrates in a hot wall, isothermal deposition system is described. The deposition temperatures are less than about 800.degree. C., and the operating pressures during deposition are such that non-equilibrium growth kinetics determine the deposition of the silicon films. An isothermal bath gas of silicon is produced allowing uniform deposition of epitaxial silicon films simultaneously on multiple substrates. This is a flow system in which means are provided for establishing an ultrahigh vacuum in the range of about 10.sup.-9 Torr prior to epitaxial deposition. The epitaxial silicon layers can be doped in-situ to provide very abruptly defined regions of either n- or p-type conductivity.
REFERENCES:
patent: 3900597 (1975-08-01), Chruma et al.
patent: 4237151 (1980-12-01), Strongin et al.
patent: 4401689 (1983-08-01), Ban
patent: 4490208 (1984-12-01), Tanaka et al.
patent: 4579609 (1986-04-01), Reif et al.
patent: 4636401 (1987-01-01), Yamazaki et al.
Meyerson, et al. "Low Temperature Silicon Epitaxy by Hot Wall Ultra High Vacuum/Low Pressure Chemical Vapor Deposition Techniques", Electrochemical Soc. Proc., Pennington, N.J. (1985) pp. 401-402.
Srinivasan, et al. "Current Status of Reduced Temperature Silicon Epitaxy by Chemical Vapor Deposition", Electrochemical Society Softbound Proc., vol. 86-5, pp. 269-285 (1986).
Meyerson et al. "Low Temperature Silicon Epitaxy by Hot Wall Ultra High Vacuum/Low Pressure Chemical Vapor Deposition Techniques", Electrochemical Soc. Softbound Proc., vol. 86-5, pp. 285-296 (1986).
Donahue, et al. "Silicon Epitaxy at 650.degree.-800.degree. Using Low-Pressure Chemical Vapor Deposition Both With and Without Plasma Enhancement", J. Appl. Phys. 57 (8), Apr. 15, 1985, pp. 2757-2765.
Ghandhi, "VLSI Fabrication Principles", John Wiley and Sons, New York, N.Y., 1983, pp. 227-231.
Bloem et al., "Epitaxial Growth of Silicon by CVD . . . ", J. Electrochem. Soc., Aug. 1985, vol. 132, No. 8, pp. 1973-1980.
Roenigk et al., "Analysis of Multicomponent LPCD Process", J. Electrochem. Soc., Feb. 1985, vol. 132, No. 2, pp. 448-454.
Ogirima et al., "Low Pressure Silicon Epitaxy", J. Electrochem. Soc., Jun. 1977, vol. 124, No. 6, pp. 903-908.
Applied Physics Letters, 48(12), p. 797, Mar. 24, 1986.
Journal of the Electrochemical Society, vol. 133, No. 6, p. 1232, Jun. 1986.
G. R. Srinivasan, J. Cryst. Growth, 70, 201 (1984).
G. R. Srinivasan, Solid State Technology, 24, 101(1981).
G. R. Srinivasan & B. S. Meyerson; Electrochemical Society Softbound Proceeding Series, Pennington, N.J. (1985).
F. Hottier et al., J. Cryst. Growth, 61, 245 (1983).
G. Ghidini & F. W. Smith, J. Electrochemical Society, 109, 1300 (1982) & IBID 131, 2924 (1984).
H. H. Lee, J. Cryst. Growth, 69, pp. 82-90 (1984).
T. Itoh et al., Applied Physics, vol. 39, No. 6, p. 2969, May 1968.
J. M. Blum et al., IBM Technical Disclosure Bulletin, vol. 24, No. 7A, p. 3224 (Dec. 1981).
Chaudhuri Olik
Harper Blaney
International Business Machines - Corporation
Ojan Ourmazd S.
Trepp Robert M.
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