Confocal laser scanning mode interference contrast microscope, a

Details Confocal laser scanning mode interference contrast microscope, a Confocal laser scanning mode interference contrast microscope, a

1994-12-28

1996-12-03

Hellner, Mark

Optics: measuring and testing

Range or remote distance finding

With photodetection

356359, G01B 1100

Patent

active

055813453

ABSTRACT:
A confocal laser scanning mode interferene contrast microscope comprises a laser source, an illuminating optical system for condensing a light beam from the laser source and forming a light spot on an object to be examined, a condensing optical system for condensing the light beam from the object to be examined on a detecting surface, a detecting device for detecting the light beam condensed on the detecting surface, the detecting device having a substrate formed with a channel waveguide and two light detecting elements, the channel waveguide having a double mode channel waveguide having an entrance end surface on the detecting surface and a waveguide fork which forks the double mode channel waveguide into two channel waveguides, the two detecting elements detecting lights propagated through the two channel waveguides, a scanning device for moving the object to be examined and the light spot relative to each other, and a signal processing device for producing differential information of the object to be examined by the detection signals of the detecting elements.

REFERENCES:
patent: 4714348 (1978-12-01), MaKosch
patent: 4978219 (1990-12-01), Bessho
patent: 5390023 (1995-02-01), Biegen
patent: 5392116 (1995-02-01), MaKosch
Ooki et al, "A novel type of laser scanning microscope: theoretical considerations," Optics Communications, 85 (1991) 177-182.
Iwasaki et al, "Laser Scanning Mode Interference Contrast (Lasmic) Microscope Using LiNbO.sub.3 Waveguide Device," Proceedings OIDTA 2nd Intl. Forum, Naha, Okinawa, Japan, Jan. 8-10, 1992.
Alferness, "Efficient waveguide electro-optic TE.revreaction.TM mode converter/wavelength filter," Appl. Phys. Lett. 36(7), 1 Apr. 1980, pp. 513-515.
Suematsu et al, "Fundamental transverse electric field (TE.sub.O) mode selection for thin-film asymmetric light guides," Appl. Phys. Lett., vol. 21, No. 6, 15 Sep. 1972, pp. 291-293.
Kumar et al, "Performance of a dual-mode-single-mode waveguide coupler as a modal filter," Applied Optics, vol. 31, No. 24, 20 Aug. 1992, pp. 5092-5095.
Wei et al, "Novel TE-TM mode splitter on lithium niobate using nickel indiffusion and proton exchange techniques" Electronics Letters, vol. 30, No. 1, 6 Jan. 1994, pp. 35-37.
Haruna et al, "An Efficient TE-TM Mode Converter Using a Z-Propagation LiNbO.sub.3 Waveguide," Transactions of the IECE of Japan, vol. E69, No. 4, Apr. 1986, pp. 418-419.
O Plus E, No. 155, pp. 67-72 (Oct. 1992).

Affiliated with

Also associated with

Rating

Confocal laser scanning mode interference contrast microscope, a does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Confocal laser scanning mode interference contrast microscope, a, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Confocal laser scanning mode interference contrast microscope, a will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-789619