Method of evaluating object based upon image processing and insp

Details Method of evaluating object based upon image processing and insp Method of evaluating object based upon image processing and insp

1993-12-29

1997-06-10

Couso, Jose L.

Image analysis

Applications

Manufacturing or product inspection

G06K 900

Patent

active

056384602

ABSTRACT:
Disclosed is an evaluation method and apparatus used as when inspecting the mounted state of an IC. The evaluation method and apparatus are adapted to acquire the image of an object under inspection, subject the image to two types of image processing based upon two different evaluation methods, and inspect and evaluate the object as regards to the acceptability of soldered state, for example, based upon the results of the two evaluations.

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