Optics: measuring and testing – By dispersed light spectroscopy
Patent
1996-10-17
1999-10-26
Hantis, K P
Optics: measuring and testing
By dispersed light spectroscopy
3562372, G01J 300
Patent
active
059737786
ABSTRACT:
A method for monitoring a thin film of polyimide material on the surface of a liquid crystal display uses nonlinear second-order surface spectroscopy to monitor the condition of a surface. Electromagnetic radiation is directed towards the surface and the second harmonic or other second-order frequency responses are monitored to detect the state of the surface. Preferably, a laser, input optics and output optics are utilized to create the second-order frequency response that is detected.
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Hunt et al, "Observation . . . Generation" vol. 133, No. 3 Chemical Physics Letters Jan. 1987 pp. 189-192.
Shen et al "Probing Liquid Crystals . . . Processes" Proceedings Jul. 15-18, 1986.
Hsiung et al "Polar Ordering . . . Study", pp. 3127-3130 Chemical Physics vol. 87 No. 5 Sep. 1987.
Hsiung et al "Probing . . . Generation" pp. 4303-4309 American Physical Society Physical Review A vol. 34, No. 5 Jan. 1986.
Heinz et al "Surface Studies . . . Generations" Trends in Analytical Chemistry vol. 8 No. 6 1989 pp. 235-242.
Boeing North American Inc.
Field Harry B.
Hantis K P
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