Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1997-09-08
1999-10-26
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
G01R 3102
Patent
active
059735040
ABSTRACT:
Generally, in one aspect, apparatus features a structure for routing test signals between pads of a device under test and a tester circuit. The structure features a probe support that includes a substrate having contact points, one for each of the pads to be tested, a number of conductors for connection to the tester circuit, the number of conductors being fewer than the number of contact points on the substrate, and switching circuitry mounted on the probe support for routing the test signals between the conductors and the contact points. In another aspect, a method routes test signals between pads of a device under test and terminals of a tester circuit, the method features providing a test head in the vicinity of the device under test, the test head having a contact for each pad to be tested on the device under test and a separate conductor connecting each contact to a switching circuit located on the test head, passing test signals between the pads of the device under test and the switching circuit via the conductors, and passing test signals between the switching circuit and the terminals of the tester via wires that number fewer than half of the number of conductors on the test head.
REFERENCES:
patent: 3516077 (1970-06-01), Bobeck et al.
patent: 3577131 (1971-05-01), Morrow et al.
patent: 3673433 (1972-06-01), Kupfer
patent: 3934236 (1976-01-01), Aiken et al.
patent: 4021790 (1977-05-01), Aiken et al.
patent: 4117543 (1978-09-01), Minnick et al.
patent: 4646299 (1987-02-01), Schinabeck et al.
patent: 4692839 (1987-09-01), Lee et al.
patent: 4729166 (1988-03-01), Lee et al.
patent: 4754546 (1988-07-01), Lee et al.
patent: 4757256 (1988-07-01), Whann et al.
patent: 4758785 (1988-07-01), Rath
patent: 4778950 (1988-10-01), Lee et al.
patent: 4804132 (1989-02-01), DeFrancesco
patent: 4912399 (1990-03-01), Greub et al.
patent: 4918383 (1990-04-01), Huff et al.
patent: 4922192 (1990-05-01), Gross et al.
patent: 4954873 (1990-09-01), Lee et al.
patent: 4975638 (1990-12-01), Evans et al.
patent: 4980637 (1990-12-01), Huff et al.
patent: 5020219 (1991-06-01), Leedy
patent: 5072176 (1991-12-01), Miller et al.
patent: 5083697 (1992-01-01), Difrancesco
patent: 5103557 (1992-04-01), Leedy
patent: 5132613 (1992-07-01), Papae et al.
patent: 5180977 (1993-01-01), Huff
patent: 5264787 (1993-11-01), Woith et al.
patent: 5323107 (1994-06-01), D'Souza
patent: 5355079 (1994-10-01), Evans et al.
patent: 5378982 (1995-01-01), Feigenbaum et al.
patent: 5416429 (1995-05-01), McQuade et al.
patent: 5422574 (1995-06-01), Kister
patent: 5434513 (1995-07-01), Fujii et al.
patent: 5456404 (1995-10-01), Robinette et al.
patent: 5468157 (1995-11-01), Roebuck et al.
patent: 5469072 (1995-11-01), Williams et al.
patent: 5491427 (1996-02-01), Ueno et al.
Fisher et al, "Reducing Test Costs for High-Speed and High Pin-Count Devices", Probe Technology, Feb. 1992; Santa Clara, CA.
Fresh Quest Corporation, "Fresh Quest Corporation Announces the Deliver of QC.sup.2 .TM. Bare Die Carriers and QPC.TM. Probe Cards for the Production of Known Good Die"; Chandler, AZ (Jul. 1, 1994).
Hewlett Packard, "High Speed Wafer Probing with the HP 83000 Model F660"; 1993; Germany.
Packard Hughes Interconnect, "Science Over Art, Our New IC Membrane Test Probe"; 1993; Irvine, CA.
Packard Hughes Interconnect, "Our New IC Membrane Test Probe. It's Priced the Same, But It Costs Less.", Irvine, CA; 1993.
Kulicke & Soffa Industries Inc.
Nguyen Vinh P.
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