Very large scale integrated circuit

Details Very large scale integrated circuit Very large scale integrated circuit

1979-05-24

1982-05-11

Tokar, Michael J.

Electricity: measuring and testing

Plural, automatically sequential tests

324 73AT, 371 21, G01R 1512

Patent

active

043296408

ABSTRACT:
A monolithically very large scale integrated circuit (VLSI) having any arbitrarily given structure and an internal test circuit only requiring one, two or three additional outer terminals wherein the test circuit is integrated therein. In one embodiment the test circuit contains a counter and a combinational circuit interconnected with the counter reading outputs thereof as well as selection switches associated with test points and where the first of the additional terminals is connected to the counting input of the counter.

REFERENCES:
patent: 3961251 (1976-06-01), Hurley
patent: 3961252 (1976-06-01), Eichelberger
patent: 4139818 (1979-02-01), Schneider
S. D. Kelley, Imbedded Memory Test Methods, IBM Tech. Disc. Bull., vol. 21, No. 12, May 1979, pp. 4911-4913.
R. E. Bodner, Generation of Internal Test Signals, IBM Tech. Disc. Bull., vol. 17, No. 8, Jan. 1975, pp. 2396-2397.

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