Method of fabricating semiconductor device

Fishing – trapping – and vermin destroying

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437228, 437924, H01L 2176

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active

053690508

ABSTRACT:
A method of fabricating a semiconductor device includes the steps of forming a semiconductor layer having a convex device area and a convex alignment mark on an insulating layer. The insulating layer around the alignment mark is etched using the alignment mark as a mask to thereby form a groove around the alignment mark. A mask pattern is aligned with the device using the alignment mark surrounded by the groove as a reference point. Consequently the alignment mark can be detected using the step contour provided by the groove. This makes alignment using the so-called direct alignment technique possible, and alignment precision is improved.

REFERENCES:
patent: 3575740 (1971-04-01), Castrucci et al.
patent: 4309813 (1982-01-01), Hull
patent: 4981529 (1991-01-01), Tsujita
patent: 5252510 (1993-10-01), Lee et al.
IBM Tech. Disc. Bulletin vol. 32, No. 10B, Mar. 1990 Method of Simultaneously Defining Alignment Marks and Implantation Regions.

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