Automatic test program list generation using programmed digital

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324 73AT, 364300, 371 27, G01R 3128

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active

045504067

ABSTRACT:
A method uses a digital data processor and a manifestation of an electrical circuit for producing a digitally coded test program list. The test program list is for controlling the operation of a circuit test system in testing a printed wiring board containing the electrical circuit for electrical characteristics, the electrical circuit comprising electrical circuit components connected to conductors. The method includes the steps of selecting a sequence of test node characters that are in a sequential order between a first and last character. The data processing is controlled to generate digitally coded representations of a common list of unique pairs of test node characters, a first test node character in each pair in the list comprising a representation of a common test node character and a second test node character in each pair comprising a representation of the other test node character in the sequence of test node characters. An electrical characteristic of the electrical circuit between each pair of test nodes identified by each of a plurality of the pairs of test node characters in the common list is determined. A test program list is formed comprising representations of pairs of test node characters from the common list and representations of the electrical characteristic between the test nodes corresponding to the pairs of test node characters included in the test program list.

REFERENCES:
patent: 3931506 (1976-01-01), Borrelli et al.
patent: 4070565 (1978-01-01), Borrelli
patent: 4114093 (1978-09-01), Long
patent: 4216539 (1980-08-01), Raymond et al.
patent: 4339819 (1982-07-01), Jacobson
patent: 4365334 (1982-12-01), Smith et al.
patent: 4439858 (1984-03-01), Peterson
Thompson, Node Forcing Techniques, Marconi Instrumentation, vol. 17, No. 2, May 1980, pp. 31-33.

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