Real time data observation method and apparatus

Details Real time data observation method and apparatus Real time data observation method and apparatus

1996-05-08

1998-01-20

Canney, Vincent P.

Excavating

39518306, G06F 1100

Patent

active

057107793

ABSTRACT:
A scan cell design includes a bypass mode in which the scan input (SI) of the cell is connected directly to the scan output of the cell by a connection that bypasses the scan memory (M1) of the cell.

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IEEE, Inc., IEEE Computer Society; IEEE Standard Text Access Port and Boundary-Scan Architecture--(IEEE Std. 1149.1-1990 (Includes IEEE Std 1149.1a-1993)); Oct. 21, 1993; pp. 10-38, 10-39 and 10-40.
Paul H. Bardell, Jacob A. Abraham, William H. McAnney and Jacob Savir, "Built-In Test Theory and Implementations", 1985, pp. 103-107.
Texas Instrument's TGC 1000/TEC 1000 CMOS Arrays Design Manual, "Application Specific Integrated Circuits", 2582018-9761 Revision C, Aug. 1993, pp. 5-10-5-13.

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