Surface condition estimating apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material

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382 55, G01B 1100, G06K 900, G01N 2184

Patent

active

049899732

ABSTRACT:
An apparatus for estimating a surface condition of a plate object. The apparatus comprises a lighting unit for generating light toward the plate object. A light sensor is located out of paths of the light generated from the lighting unit for producing an electrical signal in response to light of diffused reflection from the plate object. The apparatus also includes a processing unit for processing the electrical signal fed thereto from the light sensor for producing an image including a defective portion reflective of the light of diffused reflection, and an estimating unit for estimating the surface condition of the plate object based on the defective portion of the produced image. In another aspect of the invention, the apparatus comprises a lighting unit for generating light toward the plate object. A light sensor is provided for converting brightness variations of the light impinging on the plate object into an electrical signal. The apparatus also includes a processing unit for processing the electrical signal fed thereto from the light sensor for producing a plurality of image segments forming a full image of the surface of the plate object, and an estimating unit for estimating the surface condition of the plate object based on a defective portion included in each of the image segments. The estimating unit includes means for providing a heavier weight on a defective portion of at least one of the image segments than that of the other image segments.

REFERENCES:
patent: 4002823 (1977-01-01), Van Oosterhout
patent: 4449818 (1984-05-01), Yamaguchi et al.
patent: 4468120 (1984-08-01), Tanimoto et al.
patent: 4889998 (1989-12-01), Hayano et al.
Rapa et al., "Sequencing Oblique Light" IBM Technical Disclosure Bulletin vol. 22, No. 6, (Nov. 1979), pp. 2284-2285.

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