Method to analyze particle contaminants in compressed gases

Details Method to analyze particle contaminants in compressed gases Method to analyze particle contaminants in compressed gases

1994-05-10

1997-09-09

Brock, Michael

Measuring and testing

Gas analysis

Solid content of gas

73 3103, 7386481, G01N 100

Patent

active

056659024

ABSTRACT:
A system and a method for analyzing impurities in compressed gas, a method for controlling the particle growth in the monitored gas and a method for determining the optimum monitoring temperature for an individual gas are disclosed. The system includes a source of compressed gas, a sensor for measuring particle impurity within the gas, a temperature controller for controlling the temperature of the gas prior to said gas entering the sensor, with the temperature being controlled to eliminate particle formation from molecular clustering and condensation, and a pressure balancer.

REFERENCES:
patent: 3892549 (1975-07-01), Lyschkow
patent: 4154088 (1979-05-01), Werner
patent: 5101671 (1992-04-01), Elgas
patent: 5209102 (1993-05-01), Wang et al.
patent: 5214952 (1993-06-01), Leggett et al.
Aerosol Science and Technology, "Thermal Rebound of Nanometer Particles in a Diffusion Battery", Hwa-chi Wang, vol. 18, No. 2, 1993, pp. 180-186.
Microcontamination Conference Proceedings "Particle Counting in Electronic Specialty Gases: Metrology and Applications", 1993, Wang et al., pp. 465-472.

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