Separate I.sub.DDQ -testing of signal path and bias path in an I

Details Separate I.sub.DDQ -testing of signal path and bias path in an I Separate I.sub.DDQ -testing of signal path and bias path in an I

1994-12-14

1997-04-29

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324769, 3241581, 324 731, 371 225, G01R 3126

Patent

active

056253001

ABSTRACT:
An IC is tested through I.sub.DDQ -measurements. The IC's substrate includes a region of a conductivity type with a supply node for supply of the circuit and with a biasing node for connection to a biasing voltage to bias the region. I.sub.DDQ -testing of the circuit is conducted while the supply node and the biasing node are galvanically disconnected to separate the contribution to the quiescent current from the circuit functionality features from the contribution to the quiescent current from the biasing features.

REFERENCES:
patent: 4542340 (1985-09-01), Chakravarti et al.
patent: 4835458 (1989-05-01), Kim
patent: 5057774 (1991-10-01), Verhelst et al.
patent: 5325054 (1994-06-01), Houston
patent: 5392293 (1995-02-01), Hsue
"Ultra Low Power CMOS Technology", Proc. 3-rd NASA Symposium on VLSI Design, 1991, pp. 1-11. Month unavailable.
"Design and Test Rules for CMOS Circuits to Facilitate IDDQ Testing of Bridging Faults", K.J. Lee and M.A. Breuer, IEEE Transactions on Coomputer-Aided Design, vol. II, No. 5, May 1992, pp. 659-669.
"Impact of Silicon Substrates on Leakage Currents", J.W. Slotboom, M.J.J. Theunissen and A.J.R. deKock, IEEE Electron Device Letters, vol. EDL-4, No. 11, Nov. 1983, pp. 403-406.

Affiliated with

Also associated with

Rating

Separate I.sub.DDQ -testing of signal path and bias path in an I does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Separate I.sub.DDQ -testing of signal path and bias path in an I, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Separate I.sub.DDQ -testing of signal path and bias path in an I will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-708987