Test pattern generator for testing embedded arrays

Details Test pattern generator for testing embedded arrays Test pattern generator for testing embedded arrays

1990-12-28

1994-02-08

Baker, Stephen M.

Excavating

371 223, G01R 3128

Patent

active

052854531

ABSTRACT:
An Algorithmic Test Pattern Generator (APG) of sufficient simplicity to be replicated at every pin of a tester. This APG is comprised of two counters and various controls capable of manipulating the counters and generating output data which is based on command and counter status. The circuit is capable of testing VLSI logic and analog circuitry, and is specifically well suited to test embedded arrays that can only be accessed through LSSD shift register chains.

REFERENCES:
patent: 491723 (1990-06-01), Jeffrey et al.
patent: 3781829 (1973-12-01), Singh
patent: 3783254 (1974-01-01), Eichelberger
patent: 4402081 (1983-08-01), Ichimiya et al.
patent: 4639919 (1987-01-01), Chang et al.
patent: 4670879 (1987-06-01), Okino
patent: 4807229 (1989-02-01), Tada
patent: 4862460 (1989-08-01), Yamaguchi
patent: 4928278 (1990-05-01), Otsuji et al.
patent: 4989209 (1991-01-01), Littlebury et al.
patent: 5127011 (1992-06-01), Combs et al.
"Array Test Pattern Generation Algorithms for a Per Pin Tester" IBM Technical Disclosure Bulletin, vol. 30, No. 10 pp. 116-123.
"Algorithmic Random Pattern Generation Using Deterministic Seeds" IBM Technical Disclosure Bulletin, vol. 31, No. 11 pp. 160-161, (Apr. 1989).
"Algorithmic Pattern Generation At the Tester" IBM Technical Disclosure Bulletin, vol. 32, No. 6A, pp. 76-79 (Nov. 1989).
"Modified Logic Test Hardware Enhancement" IBM Technical Disclosure Bulletin, vol. 32, No. 11, pp. 248-249 (Apr. 1990).

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