Method of making a thin-film strain gauge

Metal working – Method of mechanical manufacture – Electrical device making

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

29620, 156656, 20419215, 20419221, 427103, H01C 1712, G01L 122

Patent

active

046203656

ABSTRACT:
A thin-film strain gauge and a method for producing it are proposed; the strain gauge is advantageously capable of integration into a thin-film circuit. The strain gauge comprises an elastically deformable spring element in combination with at least one elongation-sensitive resistor. The resistor disposition (R1-R4), the low-impedance connections (L11-L42) between the various resistance regions and the associated connection tracks (L5-L8) are applied in a vacuum process, preferably by cathode sputtering. The low-impedance connections (L11-L42) and the connection tracks (L5-L8) are of material which, although different from the material making up the actual resistance region, still has approximately the same temperature coefficient of resistance, so as to preclude errors caused by temperature.

REFERENCES:
patent: 2837619 (1958-06-01), Stein
patent: 3242006 (1966-03-01), Gerstenberg
patent: 3757414 (1973-09-01), Keller
patent: 4329878 (1982-05-01), Utner et al.
J. J. Bessot et al., New Vacuum Deposition Techniques, Metal Finishing, Mar. 1980, pp. 21-26.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of making a thin-film strain gauge does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of making a thin-film strain gauge, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making a thin-film strain gauge will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-691965

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.